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Total ionizing dose test report for the SFT2222A NPN bipolar junction transistor / Dakai Chen, James Forney

Author
Chen, Dakai, 1982-
Published
Greenbelt, Maryland : National Aeronautics and Space Administration, Goddard Space Flight Center, April 2021.
Physical Description
1 online resource (approximately 22 pages) : illustrations
Additional Creators
Forney, James and Goddard Space Flight Center
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Series
Restrictions on Access
Free-to-read Unrestricted online access
Report Numbers
NAS 1.15:20210010530
Subject(s)
Note
"April 2021."
Bibliography Note
Includes bibliographical references (page 5).
Action Note
committed to retain. Federal Depository Library Program (FDLP). For information on our retention commitment, please contact Microforms and Government Information.
View MARC record | catkey: 34855045