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Image pattern recognition [electronic resource] : synthesis and analysis in biometrics / editors, Svetlana N. Yanushkevich ... [et al.] ; consulting editor, Mark S. Nixon

Published
Singapore ; Hackensack, NJ : World Scientific, c2007.
Physical Description
xxi, 430 p. : ill. ; 24 cm.
Additional Creators
Yanushkevich, Svetlana N. and Nixon, Mark S.
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Contents
Analysis in Biometrics: A Statistical Model for Biometric Verification (S N Srihari & H Srinivasan); Force Field Feature Extraction for Ear Biometrics (D J Hurley); Behavior Biometrics for Online Computer User Monitoring (A A E Ahmed & I Traore); Synthesis in Biometrics: Introduction to Synthesis in Biometrics (S N Yanushkevich et al.); Local B-Spline Multiresolution with Example in Iris Synthesis and Volumetric Rendering (F F Samavati et al.); Computational Geometry and Biometrics: On the Path to Convergence (M L Gavrilova); Biometric Systems and Applications: Large-Scale Biometric Identification: Challenges and Solutions (N K Ratha et al.); Issues Involving the Human Biometric Sensor Interface (S J Elliott et al.); Signature Analysis, Verification and Synthesis in Pervasive Environments (D V Popel); and other papers.
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ISBN
9789812569080
9812569081
Note
"Some of the new ideas were first presented at the international workshop on 'Biometric Technologies: Modeling and Simulation' held in June 2004 in Calgary, Canada."--P. vi.
Bibliography Note
Includes bibliographical references and indexes.
View MARC record | catkey: 35502433