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Electron diffraction data for silicon nitride
Author
Sharp, J. V.
Published
United Kingdom : [publisher not identified], 1972.
[Oak Ridge, Tennessee] : [U.S. Atomic Energy Commission], 1972.
Physical Description
microfiche : negative ; 11 x 15 cm
Additional Creators
Evans, A. G.
and
Hudson, B.
Full Text available online
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Report Numbers
AERE-R-7319
Other Subject(s)
*SILICON NITRIDES- MICROSTRUCTURE
ALLOTROPY
CRYSTAL LATTICES
ELECTRON DIFFRACTION
ELECTRON MICROSCOPY
N50130* -Metals, Ceramics, & Other Materials-Ceramics & Cermets-Properties, Structure & Phase Studies
Collection
U.S. Atomic Energy Commission depository collection.
Note
NSA number: NSA-28-003016
OSTI Identifier 4489480
Research organization: Originating Research Org. not identified.
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