Fourth IEEE International Symposium on Electronic Design, Test and Applications : proceedings : [Delta]'08 : 23-25 January 2008, SAR, China [electronic resource] / editors, Adam Osseiran ... [et al.] ; sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), IEEE Hong Kong ED/SSC Joint Chapter, Hong Kong University of Science and Technology ; with industrial co-sponsorship Celoxica Ltd., UK, Solomon Sytech Limited, HK, National Instruments, HK ; in cooperation with Chinese University of Hong Kong

Conference Author: IEEE International Symposium on Electronic Design, Test and Applications (4th : 2008 : Hong Kong, China)
Additional Titles: International Workshop on Electronic Design, Test and Applications and DELTA 2008
Published: Los Alamitos, Calif. : IEEE Computer Society, c2008.
Physical Description: xxi, 610 p : ill. ; 28 cm.
Additional Creators: Osseiran, Adam, IEEE Computer Society. Technical Council on Test Technology, National Instruments, IEEE Hong Kong Section Electron Devices Society, Hong Kong University of Science and Technology, and Chinese University of Hong Kong

Finding items...

Restrictions on Access

License restrictions may limit access.

Subject(s)

Genre(s)

ISBN

9780769531106
0769531105

Note

In the title, Delta is represented by the Greek letter.
"IEEE Computer Society Order Number P3110."--T.p. verso.

Bibliography Note

Includes bibliographical references and author index.

View MARC record | catkey: 38996082