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RF and microwave modeling and measurement techniques for compound field effect transistors / Jianjun Gao

Author
Gao, Jianjun, 1968-
Additional Titles
RF and microwave modeling and measurement techniques for field effect transistors
Published
Raleigh, NC : SciTech Pub., [2010]
Copyright Date
©2010
Physical Description
1 online resource (x, 339 pages) : illustrations
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Contents
Representation of Microwave Two-Port Network -- Microwave and RF Measurement Techniques -- FET Small Signal Modeling and Parameter Extraction -- FET Nonlinear Modeling and Parameter Extraction -- Microwave Noise Modeling and Parameter Extraction Technique for FETs -- Artificial Neural Network Modeling Technique for FET.
Summary
"This book is an introduction to microwave and RF signal modeling and measurement techniques for field effect transistors. It assumes only a basic course in electronic circuits and prerequisite knowledge for readers to apply the techniques and improve the performance of integrated circuits, reduce design cycles and increase their chance at first time success. The first chapters offer a general overview and discussion of microwave signal and noise matrices, and microwave measurement techniques. The following chapters address modeling techniques for field effect transistors and cover models such as: small signal, large signal, noise, and the artificial neural network based."--Pub. desc.
Subject(s)
Genre(s)
ISBN
9781613442869 (electronic bk.)
1613442866 (electronic bk.)
9781613530900 (electronic bk.)
1613530900 (electronic bk.)
9781891121890
1891121898
Bibliography Note
Includes bibliographical references and index.
View MARC record | catkey: 39313951