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DFT 2005 [electronic resource]: 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (03-05 October 2005/Monterey, CA)

Author:
Aitken, Robert
Published:
Los Alamitos : IEEE Computer Society Press Oct. 2005
Physical Description:
616 p. 09.000 x 06.000 in.
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Summary:
Annotation DFT 2005 showcases the latest research results on yield analysis and modeling, scan design and test data compression, reconfiguration, error correcting codes and circuits, and fault detection and tolerance for sensor and flash memory. Its also covers delay fault test and timing consideration, interconnect test, approaches for soft error, on-line and concurrent fault detection, fault and error tolerant systems, and test scheduling and software-based test.
Genre(s):
ISBN:
9780769524641
0769524648 (Trade Paper)
Audience Notes:
Scholarly & Professional IEEE Computer Society Press
View MARC record | catkey: 39331501