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Rapid TCR test method for tantalum-nitride resistive films
Author:
Laudel, A.
Published:
United States : [publisher not identified], 1974.
[Oak Ridge, Tennessee] : [U.S. Atomic Energy Commission], 1974.
Physical Description:
microfiche : negative ; 11 x 15 cm
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Report Numbers:
BDX-613-1167(Rev.)
Other Subject(s):
*ELECTRIC CONDUCTIVITY- MEASURING METHODS
*TANTALUM NITRIDES- ELECTRIC CONDUCTIVITY
FILMS
N50130* -Metals, Ceramics, & Other Materials-Ceramics & Cermets-Properties, Structure & Phase Studies
TEMPERATURE DEPENDENCE
Collection:
U.S. Atomic Energy Commission depository collection.
Note:
DOE contract number: AT(29-1)-613
NSA number: NSA-31-001063
OSTI Identifier 4276693
Research organization: Bendix Corp., Kansas City, Mo. (USA).
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