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X-RAY ANALYSIS METHODS APPLIED TO THE B4C-SiC SYSTEM

Author
Guzzetta, F. H.
Published
United States : [publisher not identified], 1962.
[Oak Ridge, Tennessee] : [U.S. Atomic Energy Commission], 1962.
Physical Description
microopaque : positive ; 8 x 13 cm

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Summary
A method was developed whereby a B/sub 4/C-SiC specimen can be quantitatively analyzed. The x-ray analytical technique, which depends on the ratio of the intensities of the B/sub 4/C peak at 2 THETA = 23.5 deg and the SiC peak at 2 THETA = 60 deg , has a precision of plus or minus 3%. The peak intensities were obtained via a Picker x-ray diffractometer. Another completely independent result of this investigation is that the presence of SiC has no effect on the x-ray method of determining the stoichiometry of boron carbide. (auth)
Report Numbers
KAPL-M-FHG-1
Other Subject(s)
Collection
U.S. Atomic Energy Commission depository collection.
Note
DOE contract number: W-31-109-ENG-52
NSA number: NSA-17-001383
OSTI Identifier 4787994
Research organization: Knolls Atomic Power Lab., Schenectady, N.Y.
View MARC record | catkey: 41087306