ELECTRON MICROSCOPY OF SINTERED BERYLLIA

Author: Rau, R. C.
Published: United States : [publisher not identified], 1962.
[Oak Ridge, Tennessee] : [U.S. Atomic Energy Commission], 1962.
Physical Description: microfiche : negative ; 8 x 13 cm

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Summary

S>Porosity, etching characteristics, and general microstructural features of extruded and sintered beryllium oxide were studied by means of electron microscopy. Replicas were prepared from as-polished, polished and ultrasonically cleaned, polished and etched, and fractured surfaces. The techniques used in preparing and replicating the surfaces are presented together with typical electron micrographs of the structures observed. Both pore structures and etching characteristics were shown to have a relation to the hemimorphic hexagonal crystal structure of BeO. A form of twinning possible only in hemimorphic systems was also observed. (auth)

Report Numbers

TID-18480; TM-62-10-15

Other Subject(s)

Collection

U.S. Atomic Energy Commission depository collection.

Note

DOE contract number: AT(40-1)-2847
NSA number: NSA-17-020459
OSTI Identifier 4721041
Research organization: General Electric Co. Flight Propulsion Lab. Dept., Cincinnati.

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