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Actions for Physical profile measurements in insulating layers using the ion analyser
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Physical profile measurements in insulating layers using the ion analyser
Author
Bernard, J.
Published
France : [publisher not identified], 1973.
[Oak Ridge, Tennessee] : [U.S. Atomic Energy Commission], 1973.
Physical Description
microfiche : negative ; 11 x 15 cm
Additional Creators
Bruel, M.
,
Combasson, J. L.
,
Guernet, G.
, and
Hilleret, N.
Full Text available online
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Report Numbers
CEA-CONF-2299; CONF-721226-1
Other Subject(s)
Boron ions
Depth
Ion beams
Kev range 10-100
Layers
N50140 -metals, ceramics, & other materials-ceramics & cermets-radiation effects
Nuclear reactions
Range
Silicon nitrides
Silicon
Spatial distribution silicon oxides
Collection
U.S. Atomic Energy Commission depository collection.
Note
NSA number: NSA-28-021877
OSTI Identifier 4451011
Research organization: Originating Research Org. not identified.
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