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Residual stresses VIII : selected, peer reviewed papers from the 8th European Conference on Residual Stresses (ECRS8, 2010), June 26-28, 2010, Riva del Garda, Italy / edited by Paolo Scardi and Cristy L. Azanza Ricardo

Conference Author
European Conference on Residual Stresses (8th : 2010 : Trento, Italy)
Additional Titles
Residual Stresses 8, Residual Stresses eight, and ECRS8
Published
Zurich, Switzerland ; Enfield, New Hampshire : Trans Tech Publications, [2011]
Copyright Date
©2011
Physical Description
1 online resource (547 pages) : illustrations
Additional Creators
Scardi, P. (Paolo) and Ricardo, Cristy L. Azanza
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Language Note
English.
Contents
X-Ray Diffraction Determination of Macro and Micro Stresses in SOFC Electrolyte and Evolution with Redox Cycling of the AnodeNeutron Diffraction Analysis of Load Transfer in DP 600 Steel During In Situ Tensile Tests; II. Welding; Residual Stresses in Multilayer Welds with Different Martensitic Transformation Temperatures Analyzed by High-Energy Synchrotron Diffraction; Residual Stress, Texture, and Phase Investigation of Autogenous Edge Welds Using High Energy Synchrotron Radiation; Measurement of Residual Stresses in Surface Treated Stainless Steel Groove Welds, Stability and Relaxation of Welding Residual StressesDeformation Histories Relevant to Multipass Girth Welds: Temperature, Stress and Plastic Strain Histories; Validation of Residual Stresses of Finite Element Simulation of Multi Pass Butt-Welded Plates Using the Contour Method; Developments in the Treatment of Residual Stresses in Welded Components; Numerical Investigation of the Influence of Microstructure on the Residual Stress Distribution and Distortion in DP600 Welds, and Neutron Stress Measurement of Coarse Crystal Grain in Aluminium Casting AlloyThin Film Stress and Texture Analysis at the MCX Synchrotron Radiation Beamline at ELETTRA; IV. Coatings and Thin Films; Influence of Surface Roughness on Evaluation of Stress Gradients in Coatings; Thermal Residual Stress Relaxation in Sputtered ZnO Film on (100) Si Substrate Studied In Situ by Synchrotron X-Ray Diffraction; Residual Stresses and Strength of Hard Chromium Coatings; Thickness Effect on Microstructure and Residual Stress of Annealed Copper Thin Films
Summary
"The present volume is a collection of the most significant contributions to the 8th European Conference on Residual Stresses (ECRS8), held in Riva del Garda (Trento, Italy) on June 26-28, 2010"--Preface
Subject(s)
Genre(s)
ISBN
9783038134633 (e-book)
3038134635 (e-book)
9783037850855
303785085X
Note
ISBN from publisher's Web site.
Bibliography Note
Includes bibliographical references and indexes.
View MARC record | catkey: 43628682