Compound identification of atmospheric particles. Final report, October 1980

Author: Lichtman, D.
Published: United States : [publisher not identified], 1980.
Springfield, Va. : National Technical Information Service, [approximately 1980]
Physical Description: microfiche : negative ; 11 x 15 cm

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Summary

This study tested the usefulness of several modern surface analytic techniques for compound identification of atmospheric particles, emphasis being on sulfur species. Using scanning electron microscopy (SEM) and x-ray fluorescence (energy dispersive x-ray: EDX) morphology and bulk elemental composition measurements of individual particles were obtained. A certain amount of chemical information was obtained from the analysis of Auger electron spectroscopy (AES) sulfur peaks. Samples were transferred from the SEM to the scanning AES systems, specific particles relocated and surface composition and depth profile information obtained using AES and ion bombardment. Finally, electron spectroscopy for chemical analysis (ESCA) was used to obtain sulfur peaks for all the compounds used in the AES calibration, making possible the correlation of information with that obtained with the high spatial resolution scanning Auger system. The overall approach and feasibility studies of the various technical procedures all showed positive results. It is indicated that a combination of techniques can be used successfully for compound identification of individual particles, even for particles in the 1 to 10 micrometer range or smaller.

Report Numbers

EPRI-EA-1595

Other Subject(s)

Collection

NTIS collection.

Note

OSTI Identifier 6787865
Research organization: Wisconsin Univ., Milwaukee (USA).

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