Actions for Surface characterization of ceramic materials. [LEED, AES, XPS, ion scattering spectroscopy, secondary ion mass spectroscopy].

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Surface characterization of ceramic materials. [LEED, AES, XPS, ion scattering spectroscopy, secondary ion mass spectroscopy].

Author
Somorjai, G. A.
Published
United States : [publisher not identified], 1976.
Springfield, Va. : National Technical Information Service, [approximately 1976]
Physical Description
microfiche : negative ; 11 x 15 cm
Additional Creators
Salmeron, M.

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Summary
In recent years several techniques have become available to characterize the structure and chemical composition of surfaces of ceramic materials. These techniques utilize electron scattering and scattering of ions from surfaces. Low-energy electron diffraction is used to determine the surface structure, Auger electron spectroscopy and other techniques of electron spectroscopy (ultraviolet and photoelectron spectroscopies) are employed to determine the composition of the surface. In addition the oxidation state of surface atoms may be determined using these techniques. Ion scattering mass spectrometry and secondary ion mass spectrometry are also useful in characterizing surfaces and their reactions. These techniques, their applications and the results of recent studies are discussed. 12 figures, 52 references, 2 tables.
Report Numbers
LBL-5475; CONF-760856-2
Other Subject(s)
Collection
NTIS collection.
Note
DOE contract number: W-7405-ENG-48
OSTI Identifier 7237311
Research organization: California Univ., Berkeley (USA). Lawrence Berkeley Lab.
View MARC record | catkey: 45335245