Actions for EFFECT OF MULTIPLE REFLECTIONS ON THE ACCURACY OF MICROWAVE--INTERFEROMETER MEASUREMENTS OF THE PLASMA--ELECTRON DENSITY

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EFFECT OF MULTIPLE REFLECTIONS ON THE ACCURACY OF MICROWAVE--INTERFEROMETER MEASUREMENTS OF THE PLASMA--ELECTRON DENSITY

Author
Musil, J
Published
[Place of publication not identified] : [publisher not identified], 1966.
[Oak Ridge, Tennessee] : [U.S. Atomic Energy Commission], 1966.
Physical Description
microfiche : negative ; 11 x 15 cm
Additional Creators
Zacek, F.

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Report Numbers
IPPCZ-70
Other Subject(s)
Collection
U.S. Atomic Energy Commission depository collection.
Note
NSA number: NSA-22-003018
OSTI Identifier 4498903
Research organization: Ceskoslovenska Akademie Ved, Prague. Ustav Fyziky Plazmatu.
View MARC record | catkey: 45376055