Optoelectronic metrology [electronic resource] : 28-30 September, 1998, Łańcut, Poland / Jan Owsik, Tomasz Wie̜cek, editors ; Wojciech Skrzeczanowski, Ewa Burdziakowska, co-editors ; organized by Institute of Optoelectronics, Military University of Technology, Warsaw (Poland), Central Office of Measures, Warsaw (Poland), [and] Foundation for Industrial and Environmental Science, Rzeszów (Poland) ; sponsored by Committee of Scientific Research (Poland) [and] SPIE Poland Chapter
- Published
- Bellingham, Wash., USA : SPIE, [1998]
- Copyright Date
- ©1998
- Physical Description
- xiv, 152 pages : illustrations ; 28 cm.
- Additional Creators
- Owsik, Jan, Więcek, Tomasz, Institute of Optoelectronics (Wojskowa Akademia Techniczna im. Jarosława Dąbrowskiego), Poland. Główny Urza̦d Miar, Foundation for Industrial and Environmental Science (Rzeszów, Poland), Komitet Badań Naukowych (Poland), Society of Photo-optical Instrumentation Engineers, Society of Photo-optical Instrumentation Engineers. Poland Chapter, and SPIE Digital Library
Access Online
- Series
- Subject(s)
- Note
- AVAILABLE ONLINE TO AUTHORIZED PSU USERS.
- Bibliography Note
- Includes bibliographical references and author index.
- Other Forms
- Also available in print.
- Reproduction Note
- Electronic reproduction. Bellingham, Wash. : SPIE--the International Society for Optical Engineering, 2003. Mode of access: World Wide Web. Access restricted to SPIE Digital Library subscribers.
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