Actions for Optical systems contamination and degradation II [electronic resource] : effects, measurements, and control : 2-3 August 2000, San Diego, USA

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Optical systems contamination and degradation II [electronic resource] : effects, measurements, and control : 2-3 August 2000, San Diego, USA / Philip T.C. Chen, O. Manuel Uy, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering

Published
Bellingham, Wash., USA : SPIE, [2000]
Copyright Date
©2000
Physical Description
v, 204 pages : illustrations (some color) ; 28 cm.
Additional Creators
Chen, Philip T., Uy, O. Manuel, Society of Photo-optical Instrumentation Engineers, and SPIE Digital Library
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AVAILABLE ONLINE TO AUTHORIZED PSU USERS.
Bibliography Note
Includes bibliographical references and index.
Other Forms
Also available in print.
Reproduction Note
Electronic reproduction. Bellingham, Wash. : SPIE--the International Society for Optical Engineering, 2003. Mode of access: World Wide Web. Access restricted to SPIE Digital Library subscribers.
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