Image matching and analysis [electronic resource] : 22-24 October 2001, Wuhan, China / Bir Bhanu, Jun Shen, Tianxu Zhang, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering [and] Huazhong University of Science and Technology (China) ; cosponsored by Université de Bordeaux III (France) [and others] ; supported by National Natural Science Foundation of China [and] Ministry of Education of China

Conference Author:: International Symposium on Multispectral Image Processing and Pattern Recognition (2nd : 2001 : Wuhan, China)
Published:: Bellingham, Wash., USA : SPIE, [2001]
Copyright Date:: ©2001
Physical Description:: xi, 342 pages : illustrations ; 28 cm.
Additional Creators:: Bhanu, Bir, Shen, J. (Jun), Zhang, T. (Tianxu), Society of Photo-optical Instrumentation Engineers, Hua zhong gong xue yuan, Université de Bordeaux III, Guo jia zi ran ke xue ji jin wei yuan hui (China), China. Jiao yu bu., and SPIE Digital Library

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SPIE proceedings series, 0277-786X ; v. 4552

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"Second SPIE International Symposium on Multispectral Image Processing and Pattern Recognition"--P. xi.
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Includes bibliographical references and index.

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Also available in print.

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Electronic reproduction. Bellingham, Wash. : SPIE--the International Society for Optical Engineering, 2003. Mode of access: World Wide Web. Access restricted to SPIE Digital Library subscribers.

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