Imaging and illumination for metrology and inspection [electronic resource] : 2-4 November 1994, Boston, Massachusetts / Donald J. Svetkoff, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering

Published:: Bellingham, Wash. : SPIE, [1995]
Copyright Date:: ©1995
Physical Description:: vii, 276 pages : illustrations ; 28 cm.
Additional Creators:: Svetkoff, Donald J., Society of Photo-optical Instrumentation Engineers, and SPIE Digital Library

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Proceedings of SPIE--the International Society for Optical Engineering ; v. 2348

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Includes bibliographical references and author index.

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Electronic reproduction. Bellingham, Wash. : SPIE--the International Society for Optical Engineering, 2004. Mode of access: World Wide Web. Access restricted to SPIE Digital Library subscribers.

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