Scanning probe microscopies III [electronic resource] : 6-7 February 1995, San Jose, California / Mehdi Vaez-Iravani, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering
- Additional Titles:
- Scanning probe microscopies three
Scanning probe microscopies 3 - Published:
- Bellingham, Wash., USA : SPIE, [1995]
- Copyright Date:
- ©1995
- Physical Description:
- ix, 210 pages : illustrations ; 28 cm.
- Additional Creators:
- Vaez-Iravani, Mehdi
Society of Photo-optical Instrumentation Engineers
SPIE Digital Library - Access Online:
- ezaccess.libraries.psu.edu
- Series:
- Proceedings / SPIE--the International Society for Optical Engineering, 0277-786X ; v. 2384
- Subject(s):
- Note:
- AVAILABLE ONLINE TO AUTHORIZED PSU USERS.
- Bibliography Note:
- Includes bibliographical references and index.
- Other Forms:
- Also issued in print.
- Reproduction Note:
- Electronic reproduction. Bellingham, Wash. : SPIE--the International Society for Optical Engineering, 2004. Mode of access: World Wide Web. Access restricted to SPIE Digital Library subscribers.
View MARC record | catkey: 4578158