Investigative image processing [electronic resource] : 19-20 November 1996, Boston, Massachusetts / Leonid I. Rudin, Simon K. Bramble, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cosponsored by National Institute of Standards and Technology [and others] ; cooperating organizations, National Institute of Justice [and others].
- Bellingham, Wash., USA : SPIE, 
- Copyright Date:
- Physical Description:
- v, 184 pages : illustrations ; 28 cm.
- Additional Creators:
- Rudin, Leonid I.
Bramble, Simon K.
National Institute of Standards and Technology (U.S.)
National Institute of Justice (U.S.)
Society of Photo-optical Instrumentation Engineers
SPIE Digital Library
- Proceedings / SPIE--the International Society for Optical Engineering, 0277-786X ; v. 2942
- AVAILABLE ONLINE TO AUTHORIZED PSU USERS.
- Bibliography Note:
- Includes bibliographical references and author index.
- Other Forms:
- Also issued in print.
- Reproduction Note:
- Electronic reproduction. Bellingham, Wash. : SPIE--the International Society for Optical Engineering, 2005. Mode of access: World Wide Web. Access restricted to SPIE Digital Library subscribers.
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