Testing, reliability, and application of micro- and nano-material systems IV [electronic resource] : 28 February-2 March 2006, San Diego, California, USA / Robert E. Geer [and others], chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cosponsored by ASME--American Society of Mechanical Engineers (USA) ; cooperating organizations, Intelligent Materials Forum (Japan), Jet Propulsion Laboratory (USA), National Science Foundation (USA).
- Published:
- Bellingham, Wash. : SPIE, [2006]
- Copyright Date:
- ©2006
- Physical Description:
- 1 volume (various pagings) : illustrations ; 28 cm.
- Additional Creators:
- Geer, Robert E., Society of Photo-optical Instrumentation Engineers, American Society of Mechanical Engineers, Intelligent Materials Forum (Mitō Kagaku Gijutsu Kyōkai), Jet Propulsion Laboratory (U.S.), National Science Foundation (U.S.), and SPIE Digital Library
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- Series:
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- Note:
- AVAILABLE ONLINE TO AUTHORIZED PSU USERS.
- Bibliography Note:
- Includes bibliographical references and author index.
- Other Forms:
- Also issued in print.
- Reproduction Note:
- Electronic reproduction. Bellingham, Wash. : SPIE--the International Society for Optical Engineering, 2006. Mode of access: World Wide Web. Access restricted to SPIE Digital Library subscribers.
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