Actions for Study of low-frequency excess noise in hybrid thick-film resistors

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Study of low-frequency excess noise in hybrid thick-film resistors

Author
Baker, J. P.
Published
United States : [publisher not identified], 1977.
[Oak Ridge, Tennessee] : [U.S. Atomic Energy Commission], 1977.
Physical Description
microfiche : negative ; 11 x 15 cm
Additional Creators
Kennedy, E. J. and Tucker, Jr, R. W.

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Summary
A method of measuring the excess low-frequency noise due to direct current in hybrid thick-film resistors is presented. Guidelines for low-noise design of thick-film resistors are also included. Excess noise is present in a resistor in addition to thermal noise when there is direct current flow in the resistor. An expression was developed to indicate the dependence of excess noise on resistor dimensions as well as direct current and frequency. Details of an experimental system for measuring excess noise from the thick-film resistors is shown. From the experimental data the ratio of excess noise to thermal noise was computed at each current level and frequency. Using this ratio the constants in the expression for excess noise were then determined. Among the 1k-ohm per square pastes, the DuPont 1631 type offered lowest excess noise characteristics of the four tested. The DuPont 1641 paste proved outstanding in the five 10K-ohm per square pastes tested. When trimming was required, the air-abrasive trim on the ''top-hat'' style resistor produced the least increase in excess noise.
Report Numbers
ORNL/Sub-3961/2; TR-EE/EL-8
Other Subject(s)
Collection
U.S. Atomic Energy Commission depository collection.
Note
DOE contract number: W-7405-ENG-26
OSTI Identifier 7308692
Research organization: Tennessee Univ., Knoxville (USA). Dept. of Electrical Engineering.
View MARC record | catkey: 46149749