OBSERVATION OF VOID FORMATION INDUCED BY ELECTROMIGRATION IN METALLIC FILMS. Report No. 1447

Author: Ho, P. S.
Published: [Place of publication not identified] : [publisher not identified], 1970.
[Oak Ridge, Tennessee] : [U.S. Atomic Energy Commission], 1970.
Physical Description: microfiche : negative ; 11 x 15 cm
Additional Creators: Glowinski, L. D.