Actions for X-ray fluorescent emission analysis of slurried samples of particulate solids : application to thorium and uranium oxides

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X-ray fluorescent emission analysis of slurried samples of particulate solids : application to thorium and uranium oxides

Author
Hudgens, C. R.
Published
United States : [publisher not identified], 1976.
[Oak Ridge, Tennessee] : [U.S. Atomic Energy Commission], 1976.
Physical Description
microfiche : negative ; 11 x 15 cm

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Summary
Problems of sample preparation can be avoided by analyzing the solids as slurries. A sealed sample cell with a belt-driven stirrer was constructed for use with the GE XRD-3 spectrometer. A problem arose owing to radiolytic gas; an open, bottom-window cell would solve the problem. A ThO/sub 2/ analysis was carried out; the ThO/sub 2/ assay was observed to increase with prolonged x-ray exposure. (DLC)
Report Numbers
MLM-2364(OP); CONF-761034-1
Other Subject(s)
Collection
U.S. Atomic Energy Commission depository collection.
Note
DOE contract number: E(33-1)-GEN-53
OSTI Identifier 7234656
Research organization: Mound Lab., Miamisburg, OH (USA).
View MARC record | catkey: 47030890