Determination of electromagnetic absorption parameters by reflection measurements

Author: Vittitoe, Charles N.
Published: United States : [publisher not identified], 1975.
[Oak Ridge, Tennessee] : [U.S. Atomic Energy Commission], 1975.
Physical Description: microfiche : negative ; 11 x 15 cm

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Summary

The method described is for determining the electromagnetic absorption parameters of a material by measuring the optical reflection from a thick sample. With linearly polarized incident light (both perpendicular to and parallel to the plane of incidence), the ratio of the reflected intensities at three or more angles of incidence offers promise for determining the complex index of refraction of a material for a broad range of parameter values. The method may be applicable to molten materials, such as UO2, where high temperatures cause corrosion and containment difficulties. A method is given for extending the data to neighboring frequencies. Use of the method was successful for all portions of the complex index of refraction plane except for small values of the extinction coefficient. (auth)

Report Numbers

SAND-75-0338

Other Subject(s)

Collection

U.S. Atomic Energy Commission depository collection.

Note

DOE contract number: AT(29-1)-789
NSA number: NSA-33-015179
OSTI Identifier 4073932
Research organization: Sandia Labs., Albuquerque, NM (United States).

Funding Information

Sponsored by US Energy Research and Development Administration (ERDA).

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