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Actions for CMOS latch-up analysis and prevention
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CMOS latch-up analysis and prevention
Author
Shafer, B. D.
Published
United States : [publisher not identified], 1975.
[Oak Ridge, Tennessee] : [U.S. Atomic Energy Commission], 1975.
Physical Description
microfiche : negative ; 11 x 15 cm
Full Text available online
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Report Numbers
SAND-75-0371
Other Subject(s)
Integrated circuits- physical radiation effects
440200 -instrumentation-radiation effects on instrument components, instruments, or electronic systems
Carrier lifetime
Electric currents
Mathematical models
N46300 -instrumentation-radiation effects on instrument components, instruments, or electronic systems
Semiconductor rectifiers
Transistors
Collection
U.S. Atomic Energy Commission depository collection.
Note
DOE contract number: AT(29-1)-789
NSA number: NSA-32-022408
OSTI Identifier 4177916
Research organization: Sandia Labs., Albuquerque, NM (United States).
Funding Information
Sponsored by US Energy Research and Development Administration (ERDA).
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