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Opto-mechanical scanning technique for pattern recognition

Author
Igel, E. A.
Published
United States : [publisher not identified], 1976.
[Oak Ridge, Tennessee] : [U.S. Atomic Energy Commission], 1976.
Physical Description
microfiche : negative ; 11 x 15 cm
Additional Creators
Gobeli, G. W.

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Summary
An opto-mechanical scanning technique and initial experiments are described in which characteristics of undirectional resolution produced by one-dimensional imaging is used both for detection and geometric classification of linear arrays. Classification is achieved by angular identification of linear arrays.
Report Numbers
SAND-75-0660
Other Subject(s)
Collection
U.S. Atomic Energy Commission depository collection.
Note
DOE contract number: AT(29-1)-789
OSTI Identifier 7361570
Research organization: Sandia Labs., Albuquerque, N.Mex. (USA).
View MARC record | catkey: 47032650