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Behavior of implanted D and He in pyrolytic graphite

Author
Langley, R. A.
Published
United States : [publisher not identified], 1978.
[Oak Ridge, Tennessee] : [U.S. Atomic Energy Commission], 1978.
Physical Description
microfiche : negative ; 11 x 15 cm
Additional Creators
Blewer, R. S. and Roth, J.

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Summary
The behavior of deuterium and helium implanted near room temperature at 8 keV into prism plane oriented graphite was studied as a function of implantation fluence and post-anneal temperature. Depth profiles of the implanted species were measured by proton backscattering. Quantitative thermal desorption measurements were performed to study the species emitted from the sample during ramp heating to 950/sup 0/C.
Report Numbers
SAND-78-0754C; CONF-780467-5
Other Subject(s)
Collection
U.S. Atomic Energy Commission depository collection.
Note
DOE contract number: EY-76-C-14-0789; W-7405-ENG-26
OSTI Identifier 7058891
Research organization: Max-Planck-Institut fuer Plasmaphysik, Garching/Muenchen (Germany, F.R.).
Research organization: Sandia Labs., Albuquerque, NM (USA).
View MARC record | catkey: 47033323