Catalog
Bookmarks
0
Course Reserves
My Account
Advanced search
Search in
Keyword
Title
Author/Creator
Subject
Browse by LC Call Number
Browse by Author
Browse by Subject
search for
Search
Search
Advanced search
Start Over
Actions for STATISTICAL THEORY OF DESIGN FOR PLATING THICKNESS MEASUREMENTS BY RADIATION BACKSCATTER METHODS
Share
Email
RIS file
Bookmark
Report an Issue
STATISTICAL THEORY OF DESIGN FOR PLATING THICKNESS MEASUREMENTS BY RADIATION BACKSCATTER METHODS
Author
Fox, J. D.
Published
[Place of publication not identified] : [publisher not identified], 1969.
[Oak Ridge, Tennessee] : [U.S. Atomic Energy Commission], 1969.
Physical Description
microfiche : negative ; 11 x 15 cm
Additional Creators
Taylor, G. M.
Full Text available online
Availability
I Want It
I Want It
Finding items...
Report Numbers
UCRL-71605; CONF-691005-2
Other Subject(s)
Backscattering
Beta particles
Beta particles/scattering by metal coatings, use in thickness determination
Coating
Coatings/thickness measurements using radiation backscatter methods, accuracy and standards for
Efficiency
Fluorescence
Materials testing
Measurement
N24500 -engineering-materials testing
Nondestructive testing
Scattering
Statistics
Thickness
X radiation
X-ray fluorescence analysis/use in determining plating thicknesses
Collection
U.S. Atomic Energy Commission depository collection.
Note
NSA number: NSA-23-043478
OSTI Identifier 4768022
Research organization: California Univ., Livermore. Lawrence Radiation Lab.
View MARC record
| catkey: 47038261