Actions for Si(Li) x-ray detectors with amorphous silicon passivation

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Si(Li) x-ray detectors with amorphous silicon passivation

Author
Walton, J. T.
Published
United States : [publisher not identified], 1983
Springfield, Va.: National Technical Information Service, [approximately 1983]
Physical Description
microfiche : negative ; 11 x 15 cm
Additional Creators
Cork, C. P., Pehl, R. H., and Wong, Y. K.

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Summary
Lithium-drifted silicon (Si(Li)) detectors with thin lithium n/sup +/ contacts and amorphous silicon (..cap alpha..-Si) junction passivation are described. These detectors (7 mm thick, 9 cm2 area) are intended for use in a six element detector array which is designed to measure trace amounts of plutonium in soil samples. Results are given showing a spectral resolution of approx. 400 eV (FWHM) for the 17.8 keV N/sub p/ L x-rays entering through either these detectors. Measurements on the effects of the fractional H2 concentration on the electrical behavior of the ..cap alpha..-Si/Si interface are reported. The increase with time in the lithium window thickness when the detectors are stored at room temperature is discussed.
Report Numbers
DE84006060; LBL-15908; CONF-831015-33
Other Subject(s)
Collection
NTIS collection.
Note
DOE contract number: AC03-76SF00098
OSTI Identifier 5235709
Research organization: Lawrence Berkeley Lab., CA (USA).
View MARC record | catkey: 47337218