Actions for Determination of specific site occupations in single crystals by channelling enhanced microanalysis : principles and applications

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Determination of specific site occupations in single crystals by channelling enhanced microanalysis : principles and applications

Author
Krishnan, K. M.
Published
United States : [publisher not identified], 1984
Springfield, Va.: National Technical Information Service, [approximately 1984]
Physical Description
microfiche : negative ; 11 x 15 cm

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Summary
A technique that enhances the potential of energy dispersive x-ray microanalysis is materials characterization called ''Channelling Enhanced Microanalysis'' has been developed. This technique, based on the orientation dependence of electron-induced characteristic x-ray emissions was then used to determine preferential site occupations of elemental additions in magnetic materials. 111 references.
Report Numbers
DE84007975; LBL-17282
Other Subject(s)
Collection
NTIS collection.
Note
DOE contract number: AC03-76SF00098
OSTI Identifier 5176102
Research organization: Lawrence Berkeley Lab., CA (USA).
View MARC record | catkey: 47338260