Pulsed CO2 laser interaction with doped silicon can produce significant heating of the semiconductor. This heating is studied and two major applications are explored. Fast CO2 laser detection due to the rapid thermal generation of carriers is demonstrated.
DOE contract number: AC02-81ER10978 OSTI Identifier 5256040 Research organization: State Univ. of New York, Buffalo (USA). Dept. of Electrical and Computer Engineering.