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Actions for Dielectronic recombination measurements on multicharged ions
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Dielectronic recombination measurements on multicharged ions
Author
Dittner, P. F.
Published
United States : [publisher not identified], 1985
Springfield, Va.: National Technical Information Service, [approximately 1985]
Physical Description
microfiche : negative ; 11 x 15 cm
Additional Creators
Datz, S.
,
Miller, P. D.
, and
Pepmiller, P. L.
Full Text available online
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Summary
Coaxial electron beams and multiply charged ion beams are used to study dielectronic recombination. The study includes recombination of boron, carbon and sulfur. 3 refs., 7 figs. (WRF)
Report Numbers
DE86002255; CONF-8410237-4
Other Subject(s)
640304 - atomic, molecular & chemical physics- collision phenomena
74 atomic and molecular physics
Boron ions
Carbon ions
Charged particles
Collisions
Cross sections
Data
Electron collisions
Electron-ion collisions
Energy levels
Energy range
Excited states
Experimental data
Information
Ion collisions
Ions
Kev range 01-10.
Kev range
Multicharged ions
Numerical data
Recombination
Rydberg states
Sulfur ions
Collection
NTIS collection.
Note
DOE contract number: AC05-84OR21400
OSTI Identifier 6374073
Research organization: Oak Ridge National Lab., TN (USA).
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