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Atom probe field ion microscopy

Author
Miller, M. K.
Published
United States : [publisher not identified], 1986
Springfield, Va.: National Technical Information Service, [approximately 1986]
Physical Description
microfiche : negative ; 11 x 15 cm

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Summary
The atom probe field-ion microscope (APFIM) is a very powerful instrument for microstructural and chemical analysis down to the atomic level of a wide range of materials. The principles of the instrument are described.
Report Numbers
DE86008532; CONF-860829-7
Other Subject(s)
Collection
NTIS collection.
Note
DOE contract number: AC05-84OR21400
OSTI Identifier 5716568
Research organization: Oak Ridge National Lab., TN (USA).
View MARC record | catkey: 47362957