Advances in psychological and educational measurement / edited by Dato N. M. de Gruijter and Leo J. Th. van der Kamp

Conference Author: International Symposium on Educational Testing (2d : 1975 : Montreux, Switzerland)
Published: London ; New York : Wiley, [1976]
Copyright Date: ©1976
Physical Description: x, 320 pages ; 24 cm
Additional Creators: Gruijter, Dato N. de., Kamp, Leo J. Th. van der, and Rijksuniversiteit te Leiden. Educational Research Centre

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ISBN

0471018171

Note

Proceedings of the Symposium sponsored by the Educational Research Centre of the University of Leyden.
Includes indexes.

View MARC record | catkey: 526297

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