ESD [electronic resource] : failure mechanisms and models / Steven H. Voldman

Author:: Voldman, Steven H.
Additional Titles:: Electrostatic discharge
Published:: Chichester, West Sussex, U.K. ; Hoboken, N.J. : J. Wiley, 2009.
Physical Description:: xxiv, 384 pages : illustrations ; 25 cm
Additional Creators:: Wiley InterScience (Online service)

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Contents:

Failure analysis and ESD -- Failure analysis tools, models, and physics of failure -- CMOS failure mechanisms -- CMOS circuits : receivers and off-chip drivers -- CMOS integration -- SOI ESD failure mechanisms -- RF CMOS and ESD -- Micro-electromechanical systems -- Gallium arsenide -- Smart power, LDMOS and BCD technology -- Magnetic recording -- Photo-masks and reticles : failure mechanisms.

Subject(s):

ISBN:

9780470747254
0470747250
9780470747261 (electronic bk.)
0470747269 (electronic bk.)

Note:

AVAILABLE ONLINE TO AUTHORIZED PSU USERS.

Bibliography Note:

Includes bibliographical references and index.

Reproduction Note:

Electronic reproduction. Hoboken, N.J. : Wiley InterScience, 2009. Mode of access: World Wide Web. System requirements: Web browser. Title from title screen (viewed on Sep. 30, 2009). Access may be restricted to users at subscribing institutions.

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