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Sample preparation procedure for TEM imaging of semiconductor materials / by Wendy L. Sarney

Author
Sarney, Wendy L.
Additional Titles
Sample preparation procedure for Transmission Electron Microscopy imaging of semiconductor materials
Published
Aberdeen Proving Ground, MD : Army Research Laboratory, [2004]
Physical Description
1 online resource (iv, 10 pages) : illustrations
Additional Creators
U.S. Army Research Laboratory
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Series
Restrictions on Access
Free-to-read Unrestricted online access
Report Numbers
D 101.133:3223
Subject(s)
Note
Title from title screen (viewed on Dec. 3, 2010).
"June 2004."
000688067
Bibliography Note
Includes bibliographical references.
Action Note
committed to retain. Federal Depository Library Program (FDLP). For information on our retention commitment, please contact Microforms and Government Information.
View MARC record | catkey: 6935188