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ARPA/NBS workshop III : test patterns for integrated circuits / Harry A. Schafft, editor
Author
Schafft, Harry A.
Published
Washington : U.S. Dept. of Commerce, National Bureau of Standards, 1976.
Washington : For sale by the Supt. of Docs., U.S. Govt. Print. Off.
Physical Description
v, 46 pages : illustrations ; 26 cm.
Full Text available online
Availability
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Series
Semiconductor measurement technology
NBS special publication ; 400-15.
Report Numbers
C 13.10:400-15
Subject(s)
Integrated circuits
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Testing
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Congresses
Electronic industries
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Quality control
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Congresses
Automatic data collection systems
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Congresses
Note
Consists of synopses of talks and discussions presented at the workshop held Sept. 6, 1974 in Scottsdale, Ariz.
Bibliography Note
Includes bibliographical references.
View MARC record
| catkey: 7515875