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Actions for Microelectronic test patterns : an overview
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Microelectronic test patterns : an overview / Martin G. Buehler
Author
Buehler, Martin G.
Published
[Washington] : National Bureau of Standards, 1974.
[Washington] : [for sale by the Supt. of Docs., U.S. Govt. Print. Off]
Physical Description
19 pages : illustrations ; 26 cm.
Additional Creators
United States. Defense Advanced Research Projects Agency
,
United States. Defense Nuclear Agency
, and
United States. National Bureau of Standards
Full Text available online
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Series
Semiconductor measurement technology
NBS special publication ; 400-6.
Report Numbers
C 13.10:400-6
Subject(s)
Integrated circuits
—
Testing
Electronic apparatus and appliances
—
Testing
Note
"Jointly sponsored by the Defense Advanced Research Projects Agency, the Defense Nuclear Agency, and the National Bureau of Standards."
Bibliography Note
Bibliography: page 11.
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| catkey: 7515882