Microelectronic test patterns : an overview / Martin G. Buehler

Author: Buehler, Martin G.
Published: [Washington] : National Bureau of Standards, 1974.
[Washington] : [for sale by the Supt. of Docs., U.S. Govt. Print. Off]
Physical Description: 19 pages : illustrations ; 26 cm.
Additional Creators: United States. Defense Advanced Research Projects Agency, United States. Defense Nuclear Agency, and United States. National Bureau of Standards

Finding items...

Series

Report Numbers

C 13.10:400-6

Subject(s)

Note

"Jointly sponsored by the Defense Advanced Research Projects Agency, the Defense Nuclear Agency, and the National Bureau of Standards."

Bibliography Note

Bibliography: page 11.

View MARC record | catkey: 7515882

Actions for Microelectronic test patterns : an overview