Catalog
Bookmarks
0
Course Reserves
My Account
Advanced search
Search in
Keyword
Title
Author/Creator
Subject
Browse by LC Call Number
Browse by Author
Browse by Subject
search for
Search
Search
Advanced search
Start Over
Actions for ARPA
Share
Email
RIS file
Bookmark
Report an Issue
ARPA/NBS workshop IV : surface analysis for silicon devices / [edited by] A. George Lieberman
Published
Washington : U.S. Dept. of Commerce, National Bureau of Standards, 1976.
Washington : [For sale by the Supt. of Docs., Govt. Print. Off]
Physical Description
vii, 239 pages : illustrations ; 27 cm.
Additional Creators
Lieberman, A. George (Alfred George), 1937-
and
United States. National Bureau of Standards
Full Text available online
Availability
I Want It
I Want It
Finding items...
Series
Semiconductor measurement technology
NBS special publication ; 400-23.
Report Numbers
C 13.10:400-23.
Subject(s)
Semiconductors
—
Testing
—
Congresses
Silicon
—
Testing
—
Congresses
Surfaces (Technology)
—
Analysis
—
Congresses
Spectrum analysis
—
Congresses
Note
"Contains the proceedings of the ARPA/NBS workshop IV, Surface analysis for silicon devices, held at the National Bureau of Standards on April 23-24, 1975."
"Issued March 1976."
Bibliography Note
Includes bibliographical references and index.
View MARC record
| catkey: 7515899