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A reverse-bias safe operating area transistor tester / David W. Berning
Author
Berning, David W.
Published
Washington : U.S. Dept. of Commerce, National Bureau of Standards, 1979.
Washington : For sale by the Supt. of Docs., U.S. Govt. Print. Off.
Physical Description
v, 37 pages : illustrations ; 26 cm.
Full Text available online
Availability
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Series
Semiconductor measurement technology
NBS special publication ; 400-54.
Report Numbers
C 13.10:400-54
Subject(s)
Transistors
—
Testing
—
Equipment and supplies
Bibliography Note
Includes bibliographical references (page 14).
View MARC record
| catkey: 7516006