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Handbook of nanoscopy / edited by Gustaaf Van Tendeloo, Dirk Van Dyck, and Stephen J. Pennycook

Published
Weinheim : Wiley-VCH, [2012]
[Chichester] : [John Wiley, distributor]
Copyright Date
©2012
Physical Description
2 volumes (xxx, 1,380 pages) : illustrations (some color) ; 25 cm
Additional Creators
Tendeloo, G. Van (Gustaaf), Van Dyck, Dirk, and Pennycook, Stephen J.

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Contents
v.1. The past, the present, and the future of nanoscopy / Gustaav Van Tendeloo and Dirk Van Dyck -- Transmission electron microscopy / Marc De Graef -- Atomic resolution electron microscopy / Dirk Van Dyck -- Ultrahigh-resolution transmission electron microscopy at negative spherical aberration / Knut W. Urban ... [et al.] -- Z-contrast imaging / Stephen J. Pennycook ... [et al.] -- Electron holography / Hannes Lichte -- Lorentz microscopy and electron holography of magnetic materials / Rafal E. Dunin-Borkowski ... [et al.] -- Electron tomography / Paul Anthony Midgley and Sara Bals -- Statistical parameter estimation theory - a tool for quantitative electron microscopy / Sandra Van Aert -- Dynamic transmission electron microscopy / Nigel D. Browning ... [et al.] -- Transmission electron microscopy as nanolab / Frans D. Tichelaar, Marijn A. van Huis, and Henny W. Zandbergen -- Atomic-resolution environmental transmission electron microscopy / Pratibha L. Gai and Edward D. Boyes -- Speckles in images and diffraction patterns / Michael M. J. Treacy -- Coherent electron diffractive imaging / J.M. Zuo and Weijie Huang -- Sample preparation techniques for transmission electron microscopy / Vasfi Burak Özdöl, Vesna Srot, and Peter A. van Aken -- Scanning probe microscopy - history, background, and state of the art / Ralf Heiderhoff and Ludwig Josef Balk -- Scanning probe microscopy--forces and currents in the nanoscale world / Brian J. Rodriguez ... [et al.] -- Scanning beam methods / David Joy -- Fundamentals of the focused ion beam system / Nan Yao. and v.2. Low-energy electron microscopy / Ernst Bauer -- Spin-polarized low-energy electron microscopy / Ernst Bauer -- Imaging secondary ion mass spectroscopy / Katie L. Moore, Markus Schröder, and Chris R. M. Grovenor -- Soft x-ray imaging and spectromicroscopy / Adam P. Hitchcock -- Atom probe tomography: principle and applications / Frederic Danoix and François Vurpillot -- Signal and noise maximum likelihood estimation in MRI / Jan Sijbers -- 3-D surface reconstruction from stereo scanning electron microscopy images / Shafik Huq, Andreas Koschan, and Mongi Abidi -- Nanoparticles / Miguel López-Haro ... [et al.] -- Nanowires and nanotubes / Yong Ding and Zhong Lin Wang -- Carbon nanoforms / Carla Bittencourt and Gustaaf Van Tendeloo -- Metals and alloys / Dominique Schryvers -- In situ transmission electron microscopy on metals / J.Th.M. De Hosson -- Semiconductors and semiconducting devices / Hugo Bender -- Complex oxide materials / Maria Varela ... [et al.] -- Application of transmission electron microscopy in the research of inorganic photovoltaic materials / Yanfa Yan -- Polymers / Joachim Loos -- Ferroic and multiferroic materials / Ekhard Salje -- Three-dimensional imaging of biomaterials with electron tomography / Montserrat Bárcena, Roman I. Koning, and Abraham J. Koster -- Small organic molecules and higher homologs / Ute Kolb and Tatiana E. Gorelik.
Subject(s)
ISBN
9783527317066 (cased : set)
3527317066 (cased : set)
Bibliography Note
Includes bibliographical references.
View MARC record | catkey: 8038441