Actions for Modeling and design techniques for RF power amplifiers [electronic resource]
Modeling and design techniques for RF power amplifiers [electronic resource] / Arvind Raghavan, Nuttapong Srirattana, Joy Laskar
- Author
- Raghavan, Arvind
- Published
- Hoboken, N.J. : Wiley-Interscience : IEEE Press, [2008]
- Copyright Date
- ©2008
- Physical Description
- 1 online resource (xi, 206 pages) : illustrations
- Additional Creators
- Srirattana, Nuttapong and Laskar, Joy
Access Online
- IEEE Xplore: ezaccess.libraries.psu.edu
- Contents
- Cover -- TOC36;CONTENTS -- Preface -- CH36;1 Introduction -- 146;1 Semiconductor Technology and RF Power Amplifier Design -- 146;2 Device Modeling -- 146;3 Power Amplifier IC Design -- 146;4 Power Amplifier Linearity -- 146;5 Modulation Schemes -- 146;6 Circuit Simulation -- 146;7 Load45;Pull Measurements -- References -- CH36;2 Device Modeling for CAD -- 246;1 Introduction -- 246;2 Bipolar Junction and Heterojunction Bipolar Transistors -- 246;3 Bipolar Device Models -- 246;346;1 The Ebers8211;Moll Model -- 246;346;2 The Gummel8211;Poon Model -- 246;346;3 The VBIC Model -- 246;346;4 MEXTRAM -- 246;346;5 HICUM -- 246;4 MOSFET Device Physics -- 246;5 MOSFET Device Models -- 246;546;1 The Level 1 Model -- 246;546;2 The Level 2 and Level 3 Models -- 246;546;3 BSIM -- 246;546;4 The BSIM2 and HSPICE Level 28 Models -- 246;546;5 BSIM3 -- 246;546;6 MOS Model 9 and MOS Model 11 -- 246;546;7 BSIM4 -- References -- CH36;3 Empirical Modeling of Bipolar Devices -- 346;1 Introduction -- 346;146;1 Modeling the HBT versus the BJT -- 346;146;2 Parameter Extraction -- 346;146;3 Motivation for an Empirical Bipolar Device Model -- 346;146;4 Physics45;Based and Empirical Models -- 346;146;5 Compatibility between Large45; and Small45;Signal Models -- 346;2 Model Construction and Parameter Extraction -- 346;246;1 Current Source Model -- 346;246;2 Current Source Model Parameter Extraction -- 346;246;3 Extraction of Intrinsic Capacitances -- 346;246;4 Extraction of Base Resistance -- 346;246;5 Parameter Extraction Procedure -- 346;3 Temperature45;Dependent InGaP47;GaAs HBT Large45;Signal Model -- 346;4 Empirical Si BJT Large45;Signal Model -- 346;5 Extension of the Empirical Modeling Method to the SiGe HBT -- 346;6 Summary -- References -- CH36;4 Scalable Modeling of RF MOSFETS -- 446;1 Introduction -- 446;146;1 NQS Effects -- 446;146;2 Distributed Gate Resistance -- 446;146;3 Distributed Substrate Resistance -- 446;2 Scalable Modified BSIM3v3 Model -- 446;246;1 Scalability of MOSFET Model -- 446;246;2 Extraction of Small45;Signal Model Parameters -- 446;246;3 Scalable Substrate Network Modeling -- 446;246;4 Modified BSIM3v3 Model -- 446;3 Summary -- References -- CH36;5 Power Amplifier IC Design -- 546;1 Introduction -- 546;2 Power Amplifier Design Methodology -- 546;3 Classes of Operation -- 546;4 Performance Metrics -- 546;5 Thermal Instability and Ballasting -- References -- CH36;6 Power Amplifier Design in Silicon -- 646;1 Introduction -- 646;2 A 246;445;GHz High45;Efficiency SiGe HBT Power Amplifier -- 646;246;1 Circuit Design Considerations -- 646;246;2 Analysis of Ballasting for SiGe HBT Power Amplifiers -- 646;246;3 Harmonic Suppression Filter and Output Match Network -- 646;246;4 Performance of the Power Amplifier Module -- 646;3 RF Power Amplifier Design Using Device Periphery Adjustment -- 646;346;1 Analysis of the Device Periphery Adjustment Technique -- 646;346;2 146;945;GHz CMOS Power Amplifier -- 646;346;3 146;945;GHz CDMA47;PCS SiGe HBT Power Amplifier -- 646;346;4 Nonlinear Term Cancellation for Linearity Improvement -- References -- T$1204.
- Summary
- The book covers RF power amplifier design, from device and modeling considerations to advanced circuit design architectures and techniques. It focuses on recent developments and advanced topics in this area, including numerous practical designs to back the theoretical considerations. It presents the challenges in designing power amplifiers in silicon and helps the reader improve the efficiency of linear power amplifiers, and design more accurate compact device models, with faster extraction routines, to create cost effective and reliable circuits.
- Subject(s)
- Genre(s)
- ISBN
- 9780470228319
0470228318
9780470228302 (electronic bk.)
047022830X (electronic bk.)
9786611204013
6611204016
9780471717461 (cloth)
0471717460 (cloth) - Note
- AVAILABLE ONLINE TO AUTHORIZED PSU USERS.
- Bibliography Note
- Includes bibliographical references and index.
View MARC record | catkey: 8275019