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Logic testing and design for testability / Hideo Fujiwara

Author:: Fujiwara, Hideo
Published:: Cambridge, Mass. : MIT Press, c1985.
Physical Description:: x, 284 p. : ill. ; 24 cm.

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Series:

MIT Press series in computer systems

Subject(s):

Logic circuits—Testing

ISBN:

0262060965

Note:

Includes index.

Bibliography Note:

Bibliography: p. [272]-278.

View MARC record | catkey: 838312