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Amorphous film microstructure and its device applications [electronic resource] : strain sensor, microbolometer, thin film transistor and solar cell / by Hang-Beum Shin
Author:
Shin, Hang-Beum, 1974-
Published:
[University Park, Pa.] : Pennsylvania State University, 2012.
Physical Description:
1 electronic document (166 pages)
Additional Creators:
Jackson, Thomas N.
Access Online
etda.libraries.psu.edu
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Other Subject(s):
Hydrogenated amorphous silicon
PECVD
autonomous powered circuit
uncooled IR microbolometer
strain sensor array
thin film transistor
flexible substrate
TCAD simulation
high TCR
1/f noise
normalized Hooge parameter
sputtered germanium
ZnO TFT
a-Si:H solar cellcircuit
uncooled IR microbolometer
Dissertation Note:
Ph.D. Pennsylvania State University 2012.
Note:
Mode of access: World Wide Web.
Thesis advisor: Thomas N. Jackson.
Reproduction Note:
Microfilm (positive). 1 reel ; 35 mm. (University Microfilms 36-74448)
Technical Details:
The full text of the dissertation is available as a Adobe Acrobat .pdf file ; Adobe Acrobat Reader required to view the file.
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| catkey: 9143845