Properties of x-rays -- Geometry of crystals -- Directions of diffracted beams -- Intensities of diffracted beams -- Laue photographs -- Powder photographs -- Diffractometer and spectrometer measurements -- Orientation and quality of single crystals -- Structure of polycrystalline aggregates -- Determination of crystal structure -- Precise parameter measurements -- Phase-diagram determination -- Order-disorder transformations -- Chemical analysis by x-ray diffraction -- Chemical analysis by x-ray spectrometry -- Measurement of residual stress.
